Flat film defect inspection measures
A flat film defect inspection method that can completely detect flaws that are difficult to see with only one wavelength.
We handle the "Flat Film Defect Inspection System" manufactured by Dr. Schenk (Germany). With high-speed switching technology for both bright and dark light sources, images of the same defect can be captured from up to 5 different light sources, allowing for the detection of defects that may not be easily visible with just one wavelength. This enables us to achieve a high defect classification capability, allowing for the distinction between Critical Defect, Marginal, and Negligible. 【Features】 ■ Manufactured by Dr. Schenk (Germany) ■ Capture images of the same defect from different light sources with up to 5 channels ■ Completely detect defects that are not easily visible with just one wavelength ■ High S/N ratio detection for defects due to unique high-brightness LED light sources ■ Observation of film quality such as film thickness and haze is also possible (software option) *For more details, please refer to the PDF document or feel free to contact us.
- Company：CBC
- Price：Other
